Aberration-corrected STEM allowing for atomic resolution, spot size down to ~ 70 pm.
CEOS DCOR spherical aberration corrector.
X-FEG Schottky field emission gun provides the high current, spatial and temporal coherence and brightness necessary for the achieving the best spectra and imaging conditions.
Ultra-stable 5 axis piezo-stage and drift compensation.
Allows for pm-precision measurement of atom positions/crystallographic strain.
High sensitivity EDX to sub-nm spatial resolution: SuperX windowless EDX detector.
Gatan Enfinium electron energy loss spectroscopy (EELS) allows for localised determination of bonding, e.g. oxidation states.
Most of periodic table from Li onwards.
4096 x 4096 pixel CETA CCD camera for high quality acquisition of conventional TEM images/diffraction patterns.
