Titan Themis

Titan Themis

The Titan Themis 200 is a  scanning/transmission electron microscope (S/TEM) designed to allow the structure of advanced materials to be imaged and analysed at sub-atomic resolutions.This microscope is equipped with an X-FEG Schottky field emission gun provides the high current, spatial and temporal coherence and brightness necessary for the achieving the best spectra and imaging conditions. The incorporation of a spherical aberration corrector allows STEM images with 80 pm resolution.The ultra-stable 5 axis piezo-stage and drift compensation gives the fine control and stability necessary for analysing samples at the highest resolutions.
The Titan Themis is equipped with a Super-X high sensitivity windowless EDX detector for rapid compositional analysis. The EDX spectrometer is complemented by a Gatan Enfinium EELS Detector, which improves analysis of light elements and allows additional information on bonding and oxidation states to be acquired.