FEI Scios FIB-SEM

  • High resolution (~ 1nm) FEG-SEM.
  • Ga+ focused ion beam allows milling & patterning of samples at nm length scales:
    • Cross-section preparation for TEM.
    • ‘Slice & view’ for 3D reconstruction of e.g. porous materials.
  • EDAX Hikari electron backscatter diffraction (EBSD): mapping of local crystallography, can be coupled with EDX (EDAX Octane Plus).
  • Enquiries: [email protected].
False colour SEM image of calcium titanate-supported Ni nanoparticles
False colour SEM image of calcium titanate-supported (yellow) Ni (purple) nanoparticles
Corresponding segmentated phases
Corresponding segmentated phases
SEM 3D reconstruction of solid oxide fuel cell
SEM 3D reconstruction of solid oxide fuel cell

 

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