JEOL JXA-iSP100 EPMA
EPMA provides high-precision, high-accuracy, fully quantitative chemical analysis of a wide range of solid materials with spatial resolution down to 1 micron.
Enquiries: [email protected] or [email protected]
JEOL JXA-iSP100 EPMA:
A W-filament electron probe microanalyser (EPMA)
5x wavelength dispersive X-ray spectrometers (WDS) capable of routinely analysing elements >Na.
JEOL DrySD energy dispersive X-ray spectrometer (EDS)
Panchromatic cathodoluminescnce detector.
The WDS detectors allow for determination of the local composition of materials with greater precision and down to lower concentration than with EDS.
Instrument Specification
W filament EPMA, enabling analysis of material down to ~1um with long term beam stability.
5 WDS spectrometers.
Large analysing crystals in spectrometers 2, 4 and 5 for higher precision and lower detection limits. Elemental analysis down to 10’s-100’s of ppm is possible.
Light element crystals (in addition to TAP/TAPL) on spectrometers 1 and 5 enable analysis of elements from B, C, N O and F.
Types of Analysis
The EPMA facility has strong capabilities in analysis of earth and geological materials, including a variety of natural minerals and glass, as well as materials sciences, metallurgy, biological sciences and archaeology.
We are specialists in tephra (shards of volcanic glass) and ice core tephra analysis. We have developed optimal methods of measuring the chemical composition of proximal (large diameter) and distal – crypto (<5um) tephra. We have a range of synthetic glass (MPI-DING) secondary standards and natural tephra secondary standards to ensure data quality throughout analysis. Additionally, the exceptional SE and BSE imaging and combined EDS ensures quick and easy shard identification.
We don’t just do glass analysis. We routinely analyse a wide range of earth materials, and have capability for analysis of regular silicate, sulfide, carbonate and phosphate minerals, including a wide range of primary and secondary standards to ensure data quality. We are adept at analysis of beam-sensitive materials, including hydrous minerals such as chlorite and amphibole including their halogen components. In addition to spot analysis, we can perform both thin-section scale and micrometer-scale X-ray, BSE and SE mapping of samples, with spatial resolution down to 2 microns, or image size up to 4000 x 4000 pixels.
We are open to working collaboratively and always willing to discuss analysis needs and open to development or adjustment of techniques to suit the data and sample requirements.
Enquiries: [email protected] or [email protected]