JEOL JSM-IT200 SEM

  • Tungsten filament SEM: user-friendly, low cost & high throughput, an ideal workhorse instrument.
  • Spatial resolution down to ~ 3 – 5 nm.
  • Secondary and back scatter electron detectors for topographic and compositional imaging.
  • JEOL DrySD energy dispersive X-ray spectrometer (EDX) allows elemental quantification & mapping.
  • Enquiries: [email protected].                                           
SEM image of a spider leg
SEM image of a spider leg
EDX map of a tea bag
EDX map of a tea bag