JEOL JSM-IT800 SEM
- Field emission gun (FEG) SEM: high resolution & stability.
- Various detectors allowing secondary and back scattered electron imaging.
- Spatial resolution down to ~ 1 nm.
- JEOL DrySD 30 mm2 energy dispersive X-ray spectrometer (EDX) & soft X-ray emission spectroscopy (SXES).
- SXES allows for light element analysis: metallic Li to Cl readily accessible – bonding information.
- Air-sensitive holder: transfer samples from glovebox to microscope without exposure to ambient atmosphere.
- Enquiries: [email protected].
SEM image of perovskite-supported nanoparticles